* If you want to update the article please login/register
For a variety of applications ranging from device thermal control and monitoring to thermal-energy regulation and harvesting, understanding thermal transport from micro- to nanoscale is crucial. Non-contact optical methods for measuring material conductivities have emerged over the past decade, such as time-domain and frequency-domain thermoreflectance, have emerged as highly efficient and versatile thermal metrological tools for measuring material thermal conductivities. We determine the thermal conductivities of MAPbI3 thin films deposited on different substrates by using the VPVP technique.
Source link: https://arxiv.org/abs/2205.01194v1
Due to the clear connection between mobile defects and device stability and operation degradation, Ion transport properties in metal-halide perovskite remain a subject of significant study. In the specific case of X-ray detectors, the poor current level and instability are thought to be related to the ion migration when using bias application. Electronic current continues to rise with time until reaching a steady state value within a response time that heavily depends on the applied bias in both cases. Our results support the existence of an electronic transport-ion kinetics coupling that eventually establishes the time scale of electronic current. A perovskite composition can be separated from an applied electrical field mui. The ion mobility varies owing to the bromide compound's lower ionic concentration.
Source link: https://arxiv.org/abs/2204.14009v1
* Please keep in mind that all text is summarized by machine, we do not bear any responsibility, and you should always check original source before taking any actions