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To elucidate Si particles for quantitative image processing, X-ray maps were used to elucidate Si particles for quantitative image processing. Continuously cast samples revealed Si particle coarsening, while commercially cast alloys under Si particle refinement. Despite shifts in spatial and particle size distribution, the Aspect ratio of particles remained stable through multiple FSP passes. Trends in distributions of Si particle size and nearest neighbor distances are shown by each pass.
Source link: https://doi.org/10.1007/s11661-021-06456-6
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