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However, DLC coatings can also be used as coatings with metal impurities that are attractive due to their special physical and electrical characteristics. In this regard, according to ISO 25178 u20132: 2012, 2-3D Ag-DLC thin film surfaces are characterized using the atomic force microscopy technique for advanced analysis involving multifractal and morphological properties. The surface topography of the films is changed by changing the deposition pressure, according to the Statistical and Minkowski functions results obtained from AFM results, indicating that the film's surface topography is changed by changing the deposition pressure. The generalized dimension and mass exponent trend of the studied surfaces shows the multifractal character of the tested surfaces, which are in good agreement with other AFM statistical results. The surface plasmon resonance peaks in the UV-u2013visible absorption spectrum of the samples can be observed at various working conditions and investigated by AFM and EDS findings.
Source link: https://doi.org/10.1140/epjp/s13360-022-03307-0
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